Cypher AFMs have also earned a reputation for easily achieving higher resolution than other AFMs. The MFP-3D Infinity will make your routine imaging tasks even easier and faster to complete while also supporting your most ambitious projects. Sample Type . f = 75 kHz   |   k = 2.8 N/m   |   tip coating: none. Spherical EBID carbon AFM tips with various different radii for precise nanoindentation measurements and advanced data modelling. BioLever fast (also known as BL-AC10DS); ultra small cantilever for tapping mode in liquid. Silicon probe with visible tip apex and magnetic coating for low coercivity MFM applications. It’s like a manual, but more brief and to the point regarding procedures. Asylum AFM: User Guide At its core, the Asylum AFM will provide topographic information about a sample’s surface. Tapping mode probe with a super sharp conductive single crystal diamond tip for high resolution topography and electrical imaging with long tip lifetime. tip radius = 20 - 2000 nm   |   k = 0.2 - 2000 N/m   |   tip coating: none. Nov. 2. f = 65 kHz   |   k = 2.8 N/m   |   tip coating: diamond tip. Press Release: New “Relate” Software for Correlative Imaging with Atomic Force Microscopy and Electron Microscopy.

Also known as OSCM; conductive probe with visible apex tip for electrical measurement. If you continue without changing your settings, we'll assume that you are happy to receive all cookies from this website.

f = 50 kHz   |   k = 0.1 N/m   |   tip coating: none. Oxford Instruments Asylum Research Jupiter XR Large-Sample AFM Now Includes New Ergo Software Interface for Even Greater Productivity. More than just an extended warranty, these packages provide peace of mind that your AFM is operating at peak performance and offer training opportunities for users. Asylum electrolever with visible tip apex and conductive coating for nano-electrical measurements, f = 75 kHz   |   k = 2.8 N/m   |   tip coating: Ti/Ir. Also includes PFM, STM, and EC-AFM techniques, Additional options to make the MFP-3D work for you. f = 70 kHz   |   k = 2 N/m   |   tip coating: Ti/Pt. f = 15 kHz   |   k = 0.2 N/m   |   tip coating: none. Read full article > View all news. f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoNi. Silicon probe with no reflex coating for force modulation mode. Accessories for operation in controlled liquid environments, with or without perfusion and for heating while operating in liquids.

Infinity has the widest range of imaging modes and accessories, with renowned versatility, powerful capabilities, and a system architecture ready for future expansion. Press Release: New “Relate” Software for Correlative Imaging with Atomic…, Oxford Instruments Asylum Research Releases a New Application Note: Introducing…, The AFM for Mechanobiology Webinar is an insightful overview of atomic…, The "Nanotribology with the AFM" application note describes the latest…, Plasma Technology, NanoScience, Andor, NanoAnalysis, Asylum Research, By submitting this form I agree that Oxford Instruments will process my data in the manner described in the, Measuring Nanomechanical and Thermal Properties, Measuring Nanoelectrical and Electrochemical Properties, Controlling Temperature and Gas Environment, Subjecting Samples to Other Driving Forces, Relate: software for correlative imaging with AFM, EM, EDS, and EBSD, Solar, Photovoltaics, and Thermoelectrics, Development of Custom AFM Instrumentation, Measurement of Chemical and Molecular Composition, Solar Cell Electrical and Structural Characterisation, Measurement of Polymer and Polymer Phase Properties, Imaging of Layered Polymer Structures and Failure Analysis, Characterisation of Low Dimensional Structures, Fabrication and Characterisation of Light Emitting Devices, Fast scanning with results in seconds instead of minutes, Every step of operation is simpler for remarkable productivity, Small footprint in the lab, huge potential to grow in capability, Support that goes above and beyond your expectations, Unmatched mechanical stability—noise floor, Exceptionally low drift—higher resolution and straight lattice lines, Low noise electronics—no artifacts from electronic noise sources, Supports the fastest, smallest probes (3×9 µm spot size—optional), Fast scanning that goes beyond topography—also nanomechanics, CAFM, PFM, Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus), Unmatched range of nanoelectrical and electromechanical characterization modes, Upgradeable to the Cypher ES for environmental control accessories and to Cypher VRS for video-rate imaging, Many standard operating modes and even more optional modes, Includes a standard one-year comprehensive warranty, No-charge technical support and basic applications support for life, Affordable support agreements that offer extended warranties and advanced training. Asylum electrolever with visible tip apex and conductive coating for tapping/non-contact mode. Conductive probe for electrical measurements in force modulation mode. The Asylum Research Cypher S is the base model of the Cypher AFM microscope family. f = 150 kHz   |   k =9 N/m   |   tip coating: none.

Silicon probe with Al reflex coating for force modulation mode. Ergo is the all-new Asylum AFM software, which complements our Igor Pro-based software.

f = 180 kHz   |   k = 40 N/m   |   tip coating: diamond tip. f = 75 kHz   |   k = 2.8 N/m   |   tip coating: CoCr. More than just an extended warranty, these packages provide peace of mind that your AFM is operating at peak performance and offer training opportunities for users. f = 11 kHz   |   k = 0.01 N/m   |   tip coating: none. Its inception was to alleviate time spent training lab members, and has evolved into a document to help new or sporadic users how to navigate the software, and be more efficient at operating their AFM. OTESPA with Au reflective coating; silicon probe with visible apex tip for tapping mode. Read full article > Jun 10, 2020. Silicon probe with high aspect ratio (>10) tip for deep trench imaging.